The Materials Characterization team at IBM-Almaden Research Center in San Jose, CA has an immediate full-time opening for an applied surface scientist. Experience is desired in two or more of the following techniques: XPS (x-ray photoemission spectroscopy), RBS (Rutherford backscattering), Auger, FIB/SEM/EDX (Focused ion beam/scanning electron microscopy/energy dispersive x-ray analysis), and AFM (atomic force microscopy). Microscopy experience with SEM, FIB/TEM sample preparation, mechanical sample preparation, or 3D reconstruction of images using serial acquisition is also desirable.This position requires the analyst to work independently, developing creative characterization solutions to a wide variety of sample types. Successful candidates will perform meticulous data collection, communicate the findings effectively to experts and non-experts, and work well with other characterization team members to answer challenging analysis problems.
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